Phase-Locked Loop design applied to frequency-modulated atomic force microscope
| Contribuinte(s) |
UNIVERSIDADE DE SÃO PAULO |
|---|---|
| Data(s) |
18/10/2012
18/10/2012
2011
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| Resumo |
The atomic force microscope (AFM) introduced the surface investigation with true atomic resolution. In the frequency modulation technique (FM-AFM) both the amplitude and the frequency of oscillation of the micro-cantilever must be kept constant even in the presence of tip-surface interaction forces. For that reason, the proper design of the Phase-Locked Loop (PLL) used in FM-AFM is vital to system performance. Here, the mathematical model of the FM-AFM control system is derived considering high order PLL In addition a method to design stable third-order Phase-Locked Loops is presented. (C) 2010 Elsevier B.V. All rights reserved. FAPESP CNPQ |
| Identificador |
COMMUNICATIONS IN NONLINEAR SCIENCE AND NUMERICAL SIMULATION, v.16, n.9, p.3835-3843, 2011 1007-5704 http://producao.usp.br/handle/BDPI/18680 10.1016/j.cnsns.2010.12.018 |
| Idioma(s) |
eng |
| Publicador |
ELSEVIER SCIENCE BV |
| Relação |
Communications in Nonlinear Science and Numerical Simulation |
| Direitos |
closedAccess Copyright ELSEVIER SCIENCE BV |
| Palavras-Chave | #Frequency-modulated atomic force microscopy #Phase-Locked Loops #Nonlinear dynamics #Mathematical model #NETWORKS #JITTER #Mathematics, Applied #Mathematics, Interdisciplinary Applications #Mechanics #Physics, Fluids & Plasmas #Physics, Mathematical |
| Tipo |
article original article publishedVersion |
