Porous silicon optical cavity structure applied to high sensitivity organic solvent sensor


Autoria(s): Huanca, Danilo Roque; Fernandez, Francisco Javier Ramirez; Salcedo, Walter Jaimes
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

18/10/2012

18/10/2012

2008

Resumo

The present work reports the thermal annealing process, the number of layer and electrochemical process effect in the optical response quality of Bragg and microcavity devices that were applied as organic solvent sensors. These devices have been obtained by using porous silicon (PS) technology. The optical characterization of the Bragg reflector, before annealing, showed a broad photonic band-gap structure with blue shifted and narrowed after annealing process. The electrochemical process used to obtain the PS-based device imposes the limit in the number of layers because of the chemical dissolution effect. The interface roughness minimizations in the devices have been achieved by using the double electrochemical cell setup. The microcavity devices showed to have a good sensibility for organic solvent detection. The thermal annealed device showed better sensibility feature and this result was attributed to passivation of the surface devices. (c) 2007 Elsevier Ltd. All rights reserved.

Identificador

MICROELECTRONICS JOURNAL, v.39, n.3/Abr, p.499-506, 2008

0026-2692

http://producao.usp.br/handle/BDPI/18660

10.1016/j.mejo.2007.07.025

http://dx.doi.org/10.1016/j.mejo.2007.07.025

Idioma(s)

eng

Publicador

ELSEVIER SCI LTD

Relação

Microelectronics Journal

Direitos

restrictedAccess

Copyright ELSEVIER SCI LTD

Palavras-Chave #porous silicon #photonic crystal #microcavities #optical sensors #MULTILAYER #MICROSTRUCTURE #LAYERS #Engineering, Electrical & Electronic #Nanoscience & Nanotechnology
Tipo

article

proceedings paper

publishedVersion