A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling


Autoria(s): Marquez, Carlos Ivan Castro; Tobar, Edgar Leonardo Romero; Strum, Marius; Chau, Wang Jiang
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

18/10/2012

18/10/2012

2011

Resumo

Modern Integrated Circuit (IC) design is characterized by a strong trend of Intellectual Property (IP) core integration into complex system-on-chip (SOC) architectures. These cores require thorough verification of their functionality to avoid erroneous behavior in the final device. Formal verification methods are capable of detecting any design bug. However, due to state explosion, their use remains limited to small circuits. Alternatively, simulation-based verification can explore hardware descriptions of any size, although the corresponding stimulus generation, as well as functional coverage definition, must be carefully planned to guarantee its efficacy. In general, static input space optimization methodologies have shown better efficiency and results than, for instance, Coverage Directed Verification (CDV) techniques, although they act on different facets of the monitored system and are not exclusive. This work presents a constrained-random simulation-based functional verification methodology where, on the basis of the Parameter Domains (PD) formalism, irrelevant and invalid test case scenarios are removed from the input space. To this purpose, a tool to automatically generate PD-based stimuli sources was developed. Additionally, we have developed a second tool to generate functional coverage models that fit exactly to the PD-based input space. Both the input stimuli and coverage model enhancements, resulted in a notable testbench efficiency increase, if compared to testbenches with traditional stimulation and coverage scenarios: 22% simulation time reduction when generating stimuli with our PD-based stimuli sources (still with a conventional coverage model), and 56% simulation time reduction when combining our stimuli sources with their corresponding, automatically generated, coverage models.

Sao Paulo Research Foundation FAPESP, Brazil

National Council of Technological and Scientific Development CNPq, Brazil

Identificador

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, v.27, n.4, p.485-503, 2011

0923-8174

http://producao.usp.br/handle/BDPI/18606

10.1007/s10836-011-5225-8

http://dx.doi.org/10.1007/s10836-011-5225-8

Idioma(s)

eng

Publicador

SPRINGER

Relação

Journal of Electronic Testing-theory and Applications

Direitos

restrictedAccess

Copyright SPRINGER

Palavras-Chave #System-on-chip #Functional verification #Random-constrained simulation #Functional coverage #Parameter domains #Testbench code automation #Engineering, Electrical & Electronic
Tipo

article

original article

publishedVersion