Development of Control Systems for Safety Instrumented Systems


Autoria(s): SQUILLANTE JUNIOR, R.; Santos Filho, Diolino Jose dos; Junqueira, Fabrício; Miyagi, Paulo Eigi
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

18/10/2012

18/10/2012

2011

Resumo

Safety Instrumented Systems (SIS) are designed to prevent and / or mitigate accidents, avoiding undesirable high potential risk scenarios, assuring protection of people`s health, protecting the environment and saving costs of industrial equipment. The design of these systems require formal methods for ensuring the safety requirements, but according material published in this area, has not identified a consolidated procedure to match the task. This sense, this article introduces a formal method for diagnosis and treatment of critical faults based on Bayesian network (BN) and Petri net (PN). This approach considers diagnosis and treatment for each safety instrumented function (SIF) including hazard and operability (HAZOP) study in the equipment or system under control. It also uses BN and Behavioral Petri net (BPN) for diagnoses and decision-making and the PN for the synthesis, modeling and control to be implemented by Safety Programmable Logic Controller (PLC). An application example considering the diagnosis and treatment of critical faults is presented and illustrates the methodology proposed.

Identificador

IEEE Latin American Transactions, v.9, n.4, special issue, p.451-457, 2011

1548-0992

http://producao.usp.br/handle/BDPI/18348

http://apps.isiknowledge.com/InboundService.do?Func=Frame&product=WOS&action=retrieve&SrcApp=EndNote&UT=000294173600008&Init=Yes&SrcAuth=ResearchSoft&mode=FullRecord

Idioma(s)

por

Publicador

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Relação

Ieee Latin America Transactions

Direitos

restrictedAccess

Copyright IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Palavras-Chave #safety instrumented system #critical fault diagnosis #critical fault treatment #Bayesian network #Petri net #PETRI NETS #ELEMENTARY #SIPHONS #Computer Science, Information Systems #Engineering, Electrical & Electronic
Tipo

article

original article

publishedVersion