Dynamic formation of SEBS copolymer submicrometric structures


Autoria(s): SALVADOR, Michele A.; BIANCHI, Andrea G. C.; PEREIRA-DA-SILVA, Marcelo A.; CARVALHO, Antonio J. F.; FARIA, Roberto M.
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

18/10/2012

18/10/2012

2010

Resumo

Highly ordered A-B-A block copolymer arrangements in the submicrometric scale, resulting from dewetting and solvent evaporation of thin films, have inspired a variety of new applications in the nanometric world. Despite the progress observed in the control of such structures, the intricate scientific phenomena related to regular patterns formation are still not completely elucidated. SEBS is a standard example of a triblock copolymer that forms spontaneously impressive pattern arrangements. From macroscopic thin liquid films of SEBS solution, several physical effects and phenomena act synergistically to achieve well-arranged patterns of stripes and/or droplets. That is, concomitant with dewetting, solvent evaporation, and Marangoni effect, Rayleigh instability and phase separation also play important role in the pattern formation. These two last effects are difficult to be followed experimentally in the nanoscale, which render difficulties to the comprehension of the whole phenomenon. In this paper, we use computational methods for image analysis, which provide quantitative morphometric data of the patterns, specifically comprising stripes fragmentation into droplets. With the help of these computational techniques, we developed an explanation for the final part of the pattern formation, i.e. structural dynamics related to the stripes fragmentation. (C) 2010 Elsevier Ltd. All rights reserved.

CNPq

Fapemig

FAPESP[02/07368-9]

Capes

National Institute of Science and Technology of Organic Electronics (INEO)

Identificador

POLYMER, v.51, n.18, p.4145-4151, 2010

0032-3861

http://producao.usp.br/handle/BDPI/18010

10.1016/j.polymer.2010.06.056

http://dx.doi.org/10.1016/j.polymer.2010.06.056

Idioma(s)

eng

Publicador

ELSEVIER SCI LTD

Relação

Polymer

Direitos

restrictedAccess

Copyright ELSEVIER SCI LTD

Palavras-Chave #Block copolymer #Thin films #Phase separation #ATOMIC-FORCE MICROSCOPY #TRIBLOCK COPOLYMER #BLOCK-COPOLYMERS #THIN-FILMS #SURFACE #MORPHOLOGY #PATTERNS #SOLVENT #Polymer Science
Tipo

article

original article

publishedVersion