X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals


Autoria(s): Morelhao, Sergio Luiz; REMEDIOS, Claudio M. R.; Freitas, Raul de Oliveira; SANTOS, Adenilson O. dos
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

18/04/2012

18/04/2012

2011

Resumo

X-ray multiple diffraction experiments with synchrotron radiation were carried out on pure and doped nonlinear optical crystals: NH(4)H(2)PO(4) and KH(2)PO(4) doped with Ni and Mn, respectively. Variations in the intensity profiles were observed from pure to doped samples, and these variations correlated with shifts in the structure factor phases, also known as triplet phases. This result demonstrates the potential of X-ray phase measurements to study doping in this type of single crystal. Different methodologies for probing structural changes were developed. Dynamical diffraction simulations and curve fitting procedures were also necessary for accurate phase determination. Structural changes causing the observed phase shifts are discussed.

FAPESP

CNPq

LNLS - Brazilian Synchrotron Light Laboratory

Identificador

JOURNAL OF APPLIED CRYSTALLOGRAPHY, v.44, p.93-101, 2011

0021-8898

http://producao.usp.br/handle/BDPI/15959

10.1107/S0021889810042391

http://dx.doi.org/10.1107/S0021889810042391

Idioma(s)

eng

Publicador

WILEY-BLACKWELL

Relação

Journal of Applied Crystallography

Direitos

closedAccess

Copyright WILEY-BLACKWELL

Palavras-Chave #X-ray multiple diffraction #synchrotron radiation #phase measurements #small structural changes #nonlinear optical crystals #doping #MULTIPLE DIFFRACTION #SCATTERING #REFLECTION #INTENSITY #SINGLE #WAVES #WIDTH #Crystallography
Tipo

article

original article

publishedVersion