Millimetre wave dielectric characterisation of multilayer LTCC substrate


Autoria(s): Zelenchuk, Dmitry; Fusco, Vincent; Breslin, James; Keaveney, Mike
Data(s)

08/09/2015

Resumo

The paper reports on the mm-wave characterization of a low temperature co-fired ceramic (LTCC) substrate. A substrate integrated resonator (SIW) method is presented for robust extraction of both permittivity and loss tangent of the substrate. The data obtained allow full characterization of the substrate in the 71 GHz – 95 GHz frequency range suitable for accurate modelling of E-and W-band printed circuits.

Identificador

http://pure.qub.ac.uk/portal/en/publications/millimetre-wave-dielectric-characterisation-of-multilayer-ltcc-substrate(dc4e7b54-77d8-49be-8af3-5373d1c5d804).html

Idioma(s)

eng

Direitos

info:eu-repo/semantics/closedAccess

Fonte

Zelenchuk , D , Fusco , V , Breslin , J & Keaveney , M 2015 , Millimetre wave dielectric characterisation of multilayer LTCC substrate . in Proceedings of the 45th European Microwave Conference . pp. 1033-1036 , 2015 European Microwave Week (EuMC) , Paris , France , 7-10 September .

Tipo

contributionToPeriodical