VIEWING LEED PATTERNS AS ELECTRON HOLOGRAMS
| Data(s) |
1993
|
|---|---|
| Resumo |
<p>It is shown theoretically that LEED patterns from ordered overlayer systems bear a strong relationship to electron holograms, and that phase information is recorded in the diffraction intensities. It is, therefore, possible to obtain structural information by direct holographic inversion from conventional LEED I-V spectra.</p> |
| Identificador | |
| Idioma(s) |
eng |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
HU , P & KING , D A 1993 , ' VIEWING LEED PATTERNS AS ELECTRON HOLOGRAMS ' Applied Surface Science , vol 70-1 , pp. 396-401 . |
| Palavras-Chave | #MULTIPLE-SCATTERING #ATOMIC-RESOLUTION #TENSOR LEED #PHOTOEMISSION #DIFFRACTION #SURFACE #IMAGES |
| Tipo |
article |
