Measurement method and apparatus for analysing the metal or metal ion conten of a sample
| Data(s) |
18/05/2007
|
|---|---|
| Resumo |
2. K. Gow, P.K.J Robertson, P.M. Pollard, and K. Christidis |
| Identificador | |
| Idioma(s) |
eng |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
Christidis , K , Gow , K , Robertson , P & Pollard , P 2007 , Measurement method and apparatus for analysing the metal or metal ion conten of a sample , Patent No. WO2007007078 A3 , IPC No. G01N27/48, G01N27/42, G01N33/24 . |
| Tipo |
patent |
