OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES
| Contribuinte(s) |
Longshore, RE |
|---|---|
| Data(s) |
1994
|
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
SPIE - INT SOC OPTICAL ENGINEERING |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
MCCAFFERTY , P G , SELLAI , A & DAWSON , P 1994 , OPTICAL, TOPOGRAPHICAL AND COMPOSITIONAL CHARACTERISATION OF PTSI/SI SCHOTTKY DIODES . in R E Longshore (ed.) , INFRARED DETECTORS: STATE OF THE ART II . PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) , vol. 2274 , SPIE - INT SOC OPTICAL ENGINEERING , BELLINGHAM , pp. 55-63 , Infrared Detectors - State of the Art II Conference , Canada , 24-25 July . |
| Palavras-Chave | #SURFACE PLASMON #LOW TEMPERATURE #ATOMIC FORCE MICROSCOPY #RUTHERFORD BACK SCATTERING |
| Tipo |
contributionToPeriodical |
