Sequential versus non-sequential double ionization in strong laser fields
Data(s) |
28/10/2000
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Resumo |
<p> The recollision model has been applied to separate the probability for double ionization into contributions from electron-impact ionization and electron-impact excitation for intensities at which the dielectronic interaction is important for generating double ionization. For a wavelength of 780 am, electron-impact excitation dominates just above the threshold intensity for double ionization, approximate to 1.2 x 10(14) W cm(-2), with electron-impact ionization becoming more important for higher intensities. For a wavelength of 390 nm, the ratio between electron-impact ionization and electron-impact excitation remains fairly constant for all intensities above the threshold intensity for double ionization, approximate to 6 x 10(14) W cm(-2). The results point to an explanation of the experimental results, but more detailed calculations on the behaviour of excited He+ ions are required.</p> |
Identificador | |
Idioma(s) |
eng |
Direitos |
info:eu-repo/semantics/restrictedAccess |
Fonte |
van der Hart , H W 2000 , ' Sequential versus non-sequential double ionization in strong laser fields ' Journal of Physics B: Atomic Molecular and Optical Physics , vol 33 , no. 20 , pp. L699-L705 . |
Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/3100 #Physics and Astronomy(all) #/dk/atira/pure/subjectarea/asjc/3100/3107 #Atomic and Molecular Physics, and Optics |
Tipo |
article |