Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples

Autoria(s): Wasyluk, J.; Rainey, P.V.; Perova, T.S.; Mitchell, Neil; McNeill, David; Gamble, Harold; Armstrong, Mervyn; Hurley, Richard
Data(s)

01/03/2012
Identificador

http://pure.qub.ac.uk/portal/en/publications/investigation-of-stress-and-structural-damage-in-h-and-he-implanted-ge-using-microraman-mapping-technique-on-bevelled-samples(e269d867-a76b-41cc-a007-f57c27b2c11f).html

http://dx.doi.org/10.1002/jrs.3052
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Wasyluk , J , Rainey , P V , Perova , T S , Mitchell , N , McNeill , D , Gamble , H , Armstrong , M & Hurley , R 2012 , ' Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples ' Journal of Raman Spectroscopy , vol 43 , no. 3 , pp. 448-454 . DOI: 10.1002/jrs.3052
Palavras-Chave #/dk/atira/pure/subjectarea/asjc/1600/1607 #Spectroscopy #/dk/atira/pure/subjectarea/asjc/2500 #Materials Science(all)
Tipo

article
Acesso ao item digital