Characterization of Rapid Melt Growth (RMG) Process for High Quality Thin Film Germanium on Insulator

Autoria(s): Zainal, N.; Mitchell, Neil; McNeill, David; Bain, Michael; Armstrong, Mervyn; Baine, Paul; Adley, D.; Perova, T.S.
Data(s)

01/04/2012
Identificador

http://pure.qub.ac.uk/portal/en/publications/characterization-of-rapid-melt-growth-rmg-process-for-high-quality-thin-film-germanium-on-insulator(dd9498fd-601f-4e00-8cf8-69d7bc48b77a).html

http://dx.doi.org/10.1149/1.3700467
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Zainal , N , Mitchell , N , McNeill , D , Bain , M , Armstrong , M , Baine , P , Adley , D & Perova , T S 2012 , ' Characterization of Rapid Melt Growth (RMG) Process for High Quality Thin Film Germanium on Insulator ' ECS Transactions , vol 45 , pp. 169-180 . DOI: 10.1149/1.3700467
Tipo

article
Acesso ao item digital