Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0->1 transition at 19.6 nm

Autoria(s): Zhang, J.; Warwick, P.J.; Wolfrum, E.; Key, M.H.; Danson, C.; Demir, A.; Healy, S.; Kalantar, D.; Kim, N.S.; Lewis, Ciaran; Lin, J.; MacPhee, A.; Neely, D.; Nilsen, J.; Pert, G.J.; Smith, R.; Tallents, G.J.; Wark, J.S.
Data(s)

01/06/1996
Identificador

http://pure.qub.ac.uk/portal/en/publications/characterisation-of-a-saturated-single-frequency-nelike-ge-xuv-laser-on-the-j01-transition-at-196-nm(97b63407-4e4e-4a4c-aa7c-5f16edf4e65b).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Zhang , J , Warwick , P J , Wolfrum , E , Key , M H , Danson , C , Demir , A , Healy , S , Kalantar , D , Kim , N S , Lewis , C , Lin , J , MacPhee , A , Neely , D , Nilsen , J , Pert , G J , Smith , R , Tallents , G J & Wark , J S 1996 , ' Characterisation of a saturated single frequency Ne-like Ge XUV laser on the J=0- >1 transition at 19.6 nm ' Paper presented at 5th International Conference on X-ray Lasers , Lund , Sweden , 01/06/1996 - 01/06/1996 , pp. 56-58 .
Tipo

conferenceObject
Acesso ao item digital