Characterization of x-ray lasers at short wavelengths

Autoria(s): Tallents, G.J.; Lin, J.Y.; Smith, R.; MacPhee, A.G.; Wolfrum, E.; Zhang, J.; Eker, G.; Keenan, R.; Lewis, Ciaran; Neely, D.; O'Rourke, R.M.N.; Pert, G.J.; Pestehe, S.J.; Wark, J.S.
Data(s)

01/08/1999
Identificador

http://pure.qub.ac.uk/portal/en/publications/characterization-of-xray-lasers-at-short-wavelengths(ad470bfe-f676-4c91-8462-417e0a1f93e3).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Tallents , G J , Lin , J Y , Smith , R , MacPhee , A G , Wolfrum , E , Zhang , J , Eker , G , Keenan , R , Lewis , C , Neely , D , O'Rourke , R M N , Pert , G J , Pestehe , S J & Wark , J S 1999 , ' Characterization of x-ray lasers at short wavelengths ' Paper presented at 6th International Conference on X-Ray Lasers , Kyoto , Japan , 01/08/1999 - 01/08/1999 , pp. 59-65 .
Tipo

conferenceObject
Acesso ao item digital