EMAG marches on (Electron Microscopy and Analysis 2001, M. Aindow and C.J. Kiely)


Autoria(s): Sha, Wei
Data(s)

01/01/2003

Identificador

http://pure.qub.ac.uk/portal/en/publications/emag-marches-on-electron-microscopy-and-analysis-2001-m-aindow-and-cj-kiely(f79c175e-b2d0-41f0-8061-f9122ef4cc32).html

Idioma(s)

eng

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Sha , W 2003 , ' EMAG marches on (Electron Microscopy and Analysis 2001, M. Aindow and C.J. Kiely) ' Materials World , vol 11 , no. 1 , pp. 34-34 .

Tipo

article