Application of position–sensitive atom probe in field ion microscopy

Autoria(s): Sha, Wei
Data(s)

1992
Identificador

http://pure.qub.ac.uk/portal/en/publications/application-of-positionsensitive-atom-probe-in-field-ion-microscopy(fd3c8cb4-3007-483f-b2d8-6064d3f4de9b).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Sha , W 1992 , ' Application of position–sensitive atom probe in field ion microscopy ' Cailiao Kexue Yu Gongcheng (Materials Science and Engineering) , vol 10 (3) , pp. 35-36 .
Tipo

article
Acesso ao item digital