Investigation of crystalline quality and stress in Germanium-On-Insulator layers

Autoria(s): Litvin, A.; Adley, D.; Perova, T.S.; Zainal, N.; Mitchell, Neil; McNeill, David; Bain, Michael; Armstrong, Mervyn; Baine, Paul
Data(s)

01/08/2011
Identificador

http://pure.qub.ac.uk/portal/en/publications/investigation-of-crystalline-quality-and-stress-in-germaniumoninsulator-layers(ae3ca1c8-9a52-406f-b8e1-7a12c37728ca).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Litvin , A , Adley , D , Perova , T S , Zainal , N , Mitchell , N , McNeill , D , Bain , M , Armstrong , M & Baine , P 2011 , ' Investigation of crystalline quality and stress in Germanium-On-Insulator layers ' Paper presented at 35th Annual Symposium of Microscopical Society of Ireland , Dublin , Ireland , 01/08/2011 - 01/08/2011 , pp. 62-62 .
Tipo

conferenceObject
Acesso ao item digital