Activities at the Tokyo EBIT 2010

Autoria(s): Nakamura, N.; Currell, Frederick; Hu, Mingxing; Kato, D.; Komatsu, A.; Li, Y.; Murakami, I.; Ohashi, H.; Ohtani, S.; Sakaue, H.A.; Sakurai, M.; Tona, M.; Tong, X.M.; Watanabe, H.; Watanabe, T.; Watanabe, T.; Yamada, C.; Yamamoto, N.; Yamazaki, A.
Data(s)

01/08/2010
Identificador

http://pure.qub.ac.uk/portal/en/publications/activities-at-the-tokyo-ebit-2010(dd67878f-9507-4b42-8956-cd3521d60563).html

http://dx.doi.org/10.1088/1748-0221/5/08/C08007
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Nakamura , N , Currell , F , Hu , M , Kato , D , Komatsu , A , Li , Y , Murakami , I , Ohashi , H , Ohtani , S , Sakaue , H A , Sakurai , M , Tona , M , Tong , X M , Watanabe , H , Watanabe , T , Watanabe , T , Yamada , C , Yamamoto , N & Yamazaki , A 2010 , ' Activities at the Tokyo EBIT 2010 ' Paper presented at International Symposium on Electron Beam Ion Sources and Traps , Stockholm , Sweden , 01/08/2010 - 01/08/2010 , pp. 0-0 . DOI: 10.1088/1748-0221/5/08/C08007
Tipo

conferenceObject
Acesso ao item digital