Non-destructive characterization for dielectric loss of low permittivity substrate materials

Autoria(s): Fang, X.Y.; Linton, David; Walker, C.; Collins, B.
Data(s)

01/05/2004
Identificador

http://pure.qub.ac.uk/portal/en/publications/nondestructive-characterization-for-dielectric-loss-of-low-permittivity-substrate-materials(274296fb-dc0e-49bb-b32a-a2f5d7d78165).html

http://dx.doi.org/10.1088/0957-0233/15/4/019
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Fang , X Y , Linton , D , Walker , C & Collins , B 2004 , ' Non-destructive characterization for dielectric loss of low permittivity substrate materials ' Paper presented at International Workshop on Holographic Metrology in Fluid Mechanics , Loughborough, England , United Kingdom , 01/05/2004 - 01/05/2004 , pp. 747-754 . DOI: 10.1088/0957-0233/15/4/019
Tipo

conferenceObject
Acesso ao item digital