Investigation of p-type contamination in thin SOI layers during fabrication


Autoria(s): Uppal, S.; Gay, D.L.; Armstrong, Alastair; McNeill, David; Baine, Paul; Armstrong, Mervyn; Gamble, Harold; Yallop, K.
Data(s)

01/04/1999

Identificador

http://pure.qub.ac.uk/portal/en/publications/investigation-of-ptype-contamination-in-thin-soi-layers-during-fabrication(1565b43a-4a63-4b6c-b300-0f3bce78deb5).html

Idioma(s)

eng

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Uppal , S , Gay , D L , Armstrong , A , McNeill , D , Baine , P , Armstrong , M , Gamble , H & Yallop , K 1999 , ' Investigation of p-type contamination in thin SOI layers during fabrication ' Paper presented at MRS '99 Spring Meeting , San Francisco , United States , 01/04/1999 - 01/04/1999 , pp. 0-0 .

Tipo

conferenceObject