Electromigration in copper interconnects

Autoria(s): McCusker, N.; Len, V.S.C.; McNeill, David; Armstrong, Mervyn; Gamble, Harold
Data(s)

01/06/1998
Identificador

http://pure.qub.ac.uk/portal/en/publications/electromigration-in-copper-interconnects(fab16332-1b58-4c69-bb98-de46e1093361).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

McCusker , N , Len , V S C , McNeill , D , Armstrong , M & Gamble , H 1998 , ' Electromigration in copper interconnects ' Paper presented at EMRS '98 Spring Meeting , Strasbourg , France , 01/06/1998 - 01/06/1998 , pp. 0-0 .
Tipo

conferenceObject
Acesso ao item digital