Electronic characterisation of Ge MOSTs measured at low temperature

Autoria(s): McNeill, David; Low, Yee; Tantraviwat, D.; Rainey, Paul; Baine, Paul; Mitchell, Neil; Armstrong, Mervyn; Gamble, Harold
Data(s)

01/12/2009
Identificador

http://pure.qub.ac.uk/portal/en/publications/electronic-characterisation-of-ge-mosts-measured-at-low-temperature(a976c274-3118-44c7-8273-31c9183b0dcd).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

McNeill , D , Low , Y , Tantraviwat , D , Rainey , P , Baine , P , Mitchell , N , Armstrong , M & Gamble , H 2009 , ' Electronic characterisation of Ge MOSTs measured at low temperature ' Paper presented at Materials Ireland Conference , Cork , Ireland , 01/12/2009 - 01/12/2009 , pp. 0-0 .
Tipo

conferenceObject
Acesso ao item digital