Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology

Autoria(s): Wasyluk, J.; Rainey, Paul; Perova, T.S.; Hurley, Richard; Mitchell, Neil; McNeill, David; Gamble, Harold; Armstrong, Mervyn
Data(s)

01/08/2010
Identificador

http://pure.qub.ac.uk/portal/en/publications/raman-mapping-analysis-of-structural-damage-in-ion-implanted-bevelled-ge-samples-with-application-in-smart-cut-technology(953620f5-7b1c-41bf-aa65-93b8723deafe).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Wasyluk , J , Rainey , P , Perova , T S , Hurley , R , Mitchell , N , McNeill , D , Gamble , H & Armstrong , M 2010 , ' Raman mapping analysis of structural damage in ion implanted bevelled Ge samples with application in smart cut technology ' Paper presented at Joint Microscopical Society of Ireland and Northern Ireland Biomedical Engineering Society Annual Symposium , Belfast , United Kingdom , 01/08/2010 - 01/08/2010 , pp. 0-0 .
Tipo

conferenceObject
Acesso ao item digital