Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
| Data(s) |
28/09/2009
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| Resumo |
We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of |
| Identificador |
http://dx.doi.org/10.1364/OE.17.018271 http://www.scopus.com/inward/record.url?scp=70349680899&partnerID=8YFLogxK |
| Idioma(s) |
eng |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
Nelson , A J , Toleikis , S , Chapman , H , Bajt , S , Krzywinski , J , Chalupsky , J , Juha , L , Cihelka , J , Hajkova , V , Vysin , L , Burian , T , Kozlova , M , Faustlin , R R , Nagler , B , Vinko , S M , Whitcher , T , Dzelzainis , T , Renner , O , Saksl , K , Khorsand , A R , Heimann , P A , Sobierajski , R , Klinger , D , Jurek , M , Pelka , J , Iwan , B , Andreasson , J , Timneanu , N , Fajardo , M , Wark , J S , Riley , D , Tschentscher , T , Hajdu , J & Lee , R W 2009 , ' Soft x-ray free electron laser microfocus for exploring matter under extreme conditions ' Optics Express , vol 17 , no. 20 , pp. 18271-18278 . DOI: 10.1364/OE.17.018271 |
| Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/3100/3107 #Atomic and Molecular Physics, and Optics |
| Tipo |
article |
