Settling the ‘‘Dead Layer’’ Debate in Nanoscale Capacitors


Autoria(s): Chang, Li-Wu; Alexe, M.; Scott, J.F.; Gregg, Marty
Data(s)

28/12/2009

Resumo

Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO(3)/Pt, but are relatively unaffected in Pt/BaTiO(3)/Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers".

Identificador

http://pure.qub.ac.uk/portal/en/publications/settling-the-dead-layer-debate-in-nanoscale-capacitors(ce234ec4-5ae2-43c2-9b2f-7bf20d61ba97).html

http://dx.doi.org/10.1002/adma.200901756

http://www.scopus.com/inward/record.url?scp=73949093615&partnerID=8YFLogxK

Idioma(s)

eng

Direitos

info:eu-repo/semantics/closedAccess

Fonte

Chang , L-W , Alexe , M , Scott , J F & Gregg , M 2009 , ' Settling the ‘‘Dead Layer’’ Debate in Nanoscale Capacitors ' Advanced Materials , vol 21 , no. 48 , pp. 4911-4914 . DOI: 10.1002/adma.200901756

Palavras-Chave #/dk/atira/pure/subjectarea/asjc/2200/2210 #Mechanical Engineering #/dk/atira/pure/subjectarea/asjc/2200/2211 #Mechanics of Materials #/dk/atira/pure/subjectarea/asjc/2500 #Materials Science(all)
Tipo

article