Electrical characterisation of SOI substrates incorporating WSix ground planes


Autoria(s): Armstrong, Mervyn; Bain, Michael; Baine, Paul; Gamble, Harold; McNeill, David
Data(s)

01/04/2004

Identificador

http://pure.qub.ac.uk/portal/en/publications/electrical-characterisation-of-soi-substrates-incorporating-wsix-ground-planes(a2f0eacf-a5f7-4554-a76f-542e814eb46e).html

Idioma(s)

eng

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Armstrong , M , Bain , M , Baine , P , Gamble , H & McNeill , D 2004 , ' Electrical characterisation of SOI substrates incorporating WSix ground planes ' Paper presented at NATO Advanced Research Workshop: Science & Technology of Semiconductor-On-Insulator structures devices operating in a harsh environment , Kiev , Ukraine , 01/04/2004 - 01/04/2004 , pp. 0-0 .

Tipo

conferenceObject