Electrical Properties of High-k ZrO Gate Dielectrics on Strained Ge-Rich Layers


Autoria(s): Armstrong, Mervyn; Gamble, Harold
Data(s)

01/05/2004

Identificador

http://pure.qub.ac.uk/portal/en/publications/electrical-properties-of-highk-zro-gate-dielectrics-on-strained-gerich-layers(097f6a29-9dee-4f8c-acd7-252643447019).html

Idioma(s)

eng

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Armstrong , M & Gamble , H 2004 , ' Electrical Properties of High-k ZrO Gate Dielectrics on Strained Ge-Rich Layers ' Paper presented at Intl Conf on Microelectronics (MIEL) , Nis , Serbia , 01/05/2004 - 01/05/2004 , pp. 405-407 .

Tipo

conferenceObject