Electrical Properties of High-k Ta O Gate Dielectrics on Strained Ge-Rich Layers

Autoria(s): Armstrong, Mervyn; Gamble, Harold
Data(s)

01/05/2004
Identificador

http://pure.qub.ac.uk/portal/en/publications/electrical-properties-of-highk-ta-o-gate-dielectrics-on-strained-gerich-layers(ad73e359-ac83-4b4a-9619-f3628ec6dbb9).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Armstrong , M & Gamble , H 2004 , ' Electrical Properties of High-k Ta O Gate Dielectrics on Strained Ge-Rich Layers ' Paper presented at Intl Conf on Microelectronics (MIEL) (IEEE Cat. No.04TH8716) , Nis , Serbia , 01/05/2004 - 01/05/2004 , pp. 483-486 .
Tipo

conferenceObject
Acesso ao item digital