Composition and stress analysis in Si/SiGe structures
Data(s) |
01/09/2004
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Identificador |
http://www.scopus.com/inward/record.url?scp=24644524005&partnerID=8YFLogxK |
Idioma(s) |
eng |
Direitos |
info:eu-repo/semantics/restrictedAccess |
Fonte |
Armstrong , M & Gamble , H 2004 , ' Composition and stress analysis in Si/SiGe structures ' Paper presented at Intl Conf on Electrical & Electronics Engineering, ICEEE , Acapulco , Mexico , 01/09/2004 - 01/09/2004 , pp. 226-230 . |
Tipo |
conferenceObject |