Determination of band offsets in strained-Si heterolayers

Autoria(s): Armstrong, Mervyn; Gamble, Harold
Data(s)

01/09/2004
Identificador

http://pure.qub.ac.uk/portal/en/publications/determination-of-band-offsets-in-strainedsi-heterolayers(1e8e1bb1-176c-4e46-a430-fbf1949be40f).html

http://www.scopus.com/inward/record.url?scp=4344564986&partnerID=8YFLogxK
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Armstrong , M & Gamble , H 2004 , ' Determination of band offsets in strained-Si heterolayers ' Thin Solis Films , vol 462-463 , no. SPEC. ISS. , pp. 80-84 .
Palavras-Chave #/dk/atira/pure/subjectarea/asjc/2500/2508 #Surfaces, Coatings and Films #/dk/atira/pure/subjectarea/asjc/3100/3104 #Condensed Matter Physics #/dk/atira/pure/subjectarea/asjc/3100/3110 #Surfaces and Interfaces
Tipo

article
Acesso ao item digital