Novel low temperature techniques for growth of ultrathin oxides for strained Si MOS devices
Data(s) |
01/12/2007
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Identificador |
http://www.scopus.com/inward/record.url?scp=51849158756&partnerID=8YFLogxK |
Idioma(s) |
eng |
Direitos |
info:eu-repo/semantics/restrictedAccess |
Fonte |
Armstrong , M & Gamble , H 2007 , ' Novel low temperature techniques for growth of ultrathin oxides for strained Si MOS devices ' Paper presented at Proc International Conference on Microelectronics pp429-32 , Cairo , Egypt , 01/12/2007 - 01/12/2007 , pp. 429-432 . |
Tipo |
conferenceObject |