Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability

Autoria(s): Armstrong, Mervyn; Bain, Michael; Baine, Paul; Gamble, Harold; Ruddell, Fred; Suder, Suli; Niemiec, H.; Kucewicz, W.; Sapor, M.; Grabiec, P.; Kucharski, K.; Marczewski, J.; Tomaszewski, D.
Data(s)

01/02/2008
Identificador

http://pure.qub.ac.uk/portal/en/publications/technology-of-soi-monolithic-active-pixel-detectors-for-improvement-of-iv-characteristics-and-reliability(a724a1d9-2efc-49df-a5e9-96fb9f6201d1).html

http://www.scopus.com/inward/record.url?scp=56349160628&partnerID=8YFLogxK
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Armstrong , M , Bain , M , Baine , P , Gamble , H , Ruddell , F , Suder , S , Niemiec , H , Kucewicz , W , Sapor , M , Grabiec , P , Kucharski , K , Marczewski , J & Tomaszewski , D 2008 , ' Technology of SOI Monolithic Active Pixel Detectors for Improvement of I-V Characteristics and Reliability ' Paper presented at Proc 15th IEEE Intl Conf on Mixed Design of Integrated Circuits and Systems (MIXDES) , Poznan , Poland , 01/02/2008 - 01/02/2008 , pp. 463-465 .
Tipo

conferenceObject
Acesso ao item digital