Sequential learning for adaptive critic design: An industrial control application
Data(s) |
01/09/2005
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Identificador |
http://www.scopus.com/inward/record.url?scp=33749078329&partnerID=8YFLogxK |
Idioma(s) |
eng |
Direitos |
info:eu-repo/semantics/restrictedAccess |
Fonte |
Govindhasamy , J J , McLoone , S & Irwin , G 2005 , ' Sequential learning for adaptive critic design: An industrial control application ' Paper presented at IEEE Workshop on Machine Learning for Signal Processing (MLSP) , Mystic, Ct , United States , 01/09/2005 - 01/09/2005 , pp. 265-270 . |
Tipo |
conferenceObject |