On wafer broadband measurement for substrate material characterisation

Autoria(s): Ding, Zhiguo; Linton, David
Data(s)

01/09/2006
Identificador

http://pure.qub.ac.uk/portal/en/publications/on-wafer-broadband-measurement-for-substrate-material-characterisation(799b2514-1dfd-47c6-bba6-0b4dbfdf39f4).html
Idioma(s)

eng
Direitos

info:eu-repo/semantics/restrictedAccess
Fonte

Ding , Z & Linton , D 2006 , ' On wafer broadband measurement for substrate material characterisation ' Paper presented at 1st Electronics Systemintegration Technology Conference , Dresden , Germany , 01/09/2006 - 01/09/2006 , pp. 674-678 .
Tipo

conferenceObject
Acesso ao item digital