Comments on 'application of the interface capacitance model to thin film relaxors and ferroelectrics'
Data(s) |
01/11/2006
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Identificador |
http://dx.doi.org/10.1063/1.2385627 http://www.scopus.com/inward/record.url?scp=33750925758&partnerID=8YFLogxK |
Idioma(s) |
eng |
Direitos |
info:eu-repo/semantics/restrictedAccess |
Fonte |
Gregg , M 2006 , ' Comments on 'application of the interface capacitance model to thin film relaxors and ferroelectrics' ' Applied Physics Letters , vol 89 , no. 19 , 196101 , pp. 196101-196101 . DOI: 10.1063/1.2385627 |
Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/3100/3101 #Physics and Astronomy (miscellaneous) |
Tipo |
article |