Exploring the fundamental effects of miniaturisation on ferroelectrics by focused ion beam processing of single crystal material
| Data(s) |
01/09/2005
|
|---|---|
| Identificador |
http://dx.doi.org/10.1051/jp4:2005128010 http://www.scopus.com/inward/record.url?scp=25644449592&partnerID=8YFLogxK |
| Idioma(s) |
eng |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
Saad , M , Baxter , P , Schilling , A , Adams , T , Zhu , X , Bowman , R , Gregg , M , Zubko , P , Morrison , F D & Scott , J F 2005 , ' Exploring the fundamental effects of miniaturisation on ferroelectrics by focused ion beam processing of single crystal material ' Journal De Physique Iv , vol 128 , pp. 63-71 . DOI: 10.1051/jp4:2005128010 |
| Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/3100 #Physics and Astronomy(all) |
| Tipo |
article |
