Strategies for gallium removal after focused ion beam patterning of ferroelectric oxide nanostructures
| Data(s) |
24/01/2007
|
|---|---|
| Identificador |
http://dx.doi.org/10.1088/0957-4484/18/3/035301 http://www.scopus.com/inward/record.url?scp=33846805963&partnerID=8YFLogxK |
| Idioma(s) |
eng |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
Schilling , A , Bowman , R , Scott , J F & Gregg , M 2007 , ' Strategies for gallium removal after focused ion beam patterning of ferroelectric oxide nanostructures ' Nanotechnology , vol 18 , no. 3 , 035301 , pp. 035301-5 . DOI: 10.1088/0957-4484/18/3/035301 |
| Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/2200/2201 #Engineering (miscellaneous) #/dk/atira/pure/subjectarea/asjc/2500 #Materials Science(all) #/dk/atira/pure/subjectarea/asjc/3100/3101 #Physics and Astronomy (miscellaneous) |
| Tipo |
article |
