Characteristics of single crystal "thin film" capacitor structures made using a focused ion beam microscope
| Data(s) |
16/02/2004
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|---|---|
| Identificador |
http://dx.doi.org/10.1063/1.1645318 http://www.scopus.com/inward/record.url?scp=1542784196&partnerID=8YFLogxK |
| Idioma(s) |
eng |
| Direitos |
info:eu-repo/semantics/restrictedAccess |
| Fonte |
Saad , M , Bowman , R & Gregg , M 2004 , ' Characteristics of single crystal "thin film" capacitor structures made using a focused ion beam microscope ' Applied Physics Letters , vol 84 , no. 7 , pp. 1159-1161 . DOI: 10.1063/1.1645318 |
| Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/3100/3101 #Physics and Astronomy (miscellaneous) |
| Tipo |
article |
