Low Temperature Bonding of PECVD Silicon Dioxide Layers


Autoria(s): Baine, Paul; Bain, Michael; McNeill, David; Gamble, Harold; Armstrong, Mervyn
Data(s)

01/11/2006

Identificador

http://pure.qub.ac.uk/portal/en/publications/low-temperature-bonding-of-pecvd-silicon-dioxide-layers(48235021-71f8-45e8-a2e0-5909f8776661).html

http://www.scopus.com/inward/record.url?scp=34249073156&partnerID=8YFLogxK

Idioma(s)

eng

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Baine , P , Bain , M , McNeill , D , Gamble , H & Armstrong , M 2006 , ' Low Temperature Bonding of PECVD Silicon Dioxide Layers ' ECS Transactions , vol 3(6) , no. 6 , pp. 165-173 .

Tipo

article

Palavras-Chave #/dk/atira/pure/subjectarea/asjc/2200 #Engineering(all)