Tight-binding simulation of current-carrying nanostructures
Data(s) |
25/03/2002
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Resumo |
The tight-binding (TB) approach to the modelling of electrical conduction in small structures is introduced. Different equivalent forms of the TB expression for the electrical current in a nanoscale junction are derived. The use of the formalism to calculate the current density and local potential is illustrated by model examples. A first-principles time-dependent TB formalism for calculating current-induced forces and the dynamical response of atoms is presented. An earlier expression for current-induced forces under steady-state conditions is generalized beyond local charge neutrality and beyond orthogonal TB. Future directions in the modelling of power dissipation and local heating in nanoscale conductors are discussed. |
Identificador |
http://dx.doi.org/10.1088/0953-8984/14/11/314 http://www.scopus.com/inward/record.url?scp=0037171007&partnerID=8YFLogxK |
Idioma(s) |
eng |
Direitos |
info:eu-repo/semantics/restrictedAccess |
Fonte |
Todorov , T 2002 , ' Tight-binding simulation of current-carrying nanostructures ' Journal of Physics: Condensed Matter , vol 14 , no. 11 , pp. 3049-3084 . DOI: 10.1088/0953-8984/14/11/314 |
Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/2500/2504 #Electronic, Optical and Magnetic Materials #/dk/atira/pure/subjectarea/asjc/3100/3104 #Condensed Matter Physics |
Tipo |
article |