A new device for the study of electron-ion interactions
Data(s) |
01/05/2003
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Resumo |
The conceptual design of a new electron beam ion trap primarily intended for the study of electron-ion interactions is outlined along with some preliminary predictions regarding its capabilities. (C) 2003 Elsevier Science B.V. All rights reserved. |
Identificador |
http://dx.doi.org/10.1016/S0168-583X(02)02036-0 http://www.scopus.com/inward/record.url?scp=0038670720&partnerID=8YFLogxK |
Idioma(s) |
eng |
Direitos |
info:eu-repo/semantics/restrictedAccess |
Fonte |
Currell , F , Aiken , J , Dunn , K , Lu , X , McCullough , R , Sokell , E J , O'Rourke , B , Krastev , V & Watanabe , H 2003 , ' A new device for the study of electron-ion interactions ' Nuclear Instruments & Methods in Physics Research - Section B: Beam Interactions with Materials and Atoms , vol 205 , pp. 230-233 . DOI: 10.1016/S0168-583X(02)02036-0 |
Palavras-Chave | #/dk/atira/pure/subjectarea/asjc/2500/2508 #Surfaces, Coatings and Films #/dk/atira/pure/subjectarea/asjc/3100/3105 #Instrumentation #/dk/atira/pure/subjectarea/asjc/3100/3110 #Surfaces and Interfaces |
Tipo |
article |