A new device for the study of electron-ion interactions


Autoria(s): Currell, Frederick; Aiken, John; Dunn, Kenneth; Lu, X.; McCullough, Robert; Sokell, E.J.; O'Rourke, Brian; Krastev, Vesselin; Watanabe, Hirofumi
Data(s)

01/05/2003

Resumo

The conceptual design of a new electron beam ion trap primarily intended for the study of electron-ion interactions is outlined along with some preliminary predictions regarding its capabilities. (C) 2003 Elsevier Science B.V. All rights reserved.

Identificador

http://pure.qub.ac.uk/portal/en/publications/a-new-device-for-the-study-of-electronion-interactions(fb40e969-1712-49f0-ab48-bf77225fdf35).html

http://dx.doi.org/10.1016/S0168-583X(02)02036-0

http://www.scopus.com/inward/record.url?scp=0038670720&partnerID=8YFLogxK

Idioma(s)

eng

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Currell , F , Aiken , J , Dunn , K , Lu , X , McCullough , R , Sokell , E J , O'Rourke , B , Krastev , V & Watanabe , H 2003 , ' A new device for the study of electron-ion interactions ' Nuclear Instruments & Methods in Physics Research - Section B: Beam Interactions with Materials and Atoms , vol 205 , pp. 230-233 . DOI: 10.1016/S0168-583X(02)02036-0

Palavras-Chave #/dk/atira/pure/subjectarea/asjc/2500/2508 #Surfaces, Coatings and Films #/dk/atira/pure/subjectarea/asjc/3100/3105 #Instrumentation #/dk/atira/pure/subjectarea/asjc/3100/3110 #Surfaces and Interfaces
Tipo

article