Molecular Dynamics simulation of silicon sputtering: sensitivity to the choice of potential


Autoria(s): Thijsse, B.J.; Klaver, Peter; Haddeman, E.F.C.
Data(s)

15/06/2004

Identificador

http://pure.qub.ac.uk/portal/en/publications/molecular-dynamics-simulation-of-silicon-sputtering-sensitivity-to-the-choice-of-potential(88f066e9-15e0-4586-aa6e-10568aafdde1).html

http://www.scopus.com/inward/record.url?scp=2942622274&partnerID=8YFLogxK

Idioma(s)

eng

Direitos

info:eu-repo/semantics/restrictedAccess

Fonte

Thijsse , B J , Klaver , P & Haddeman , E F C 2004 , ' Molecular Dynamics simulation of silicon sputtering: sensitivity to the choice of potential ' Applied Surface Science , vol 231-232 , pp. 29-38 .

Palavras-Chave #/dk/atira/pure/subjectarea/asjc/1600/1606 #Physical and Theoretical Chemistry #/dk/atira/pure/subjectarea/asjc/2500/2508 #Surfaces, Coatings and Films #/dk/atira/pure/subjectarea/asjc/3100/3104 #Condensed Matter Physics
Tipo

article