Impact of assembly process technologies on electronic packaging materials


Autoria(s): Tilford, Tim; Bailey, Christopher; Parrott, Kevin; Rizvi, M.J.; Yin, Chunyan; Sinclair, Keith I.; Desmulliez, Marc P.Y.
Data(s)

28/07/2008

Resumo

Assembly processes used to bond components to printed circuit boards can have a significant impact on these boards and the final packaged component. Traditional approaches to bonding components to printed circuit boards results in heat being applied across the whole board assembly. This can lead to board warpage and possibly high residual stresses. Another approach discussed in this paper is to use Variable Frequency Microwave (VFM) heating to cure adhesives and underfills and bond components to printed circuit boards. In terms of energy considerations the use of VFM technology is much more cost effective compared to convection/radiation heating. This paper will discuss the impact of traditional reflow based processes on flexible substrates and it will demonstrate the possible advantages of using localised variable frequency microwave heating to cure materials in an electronic package.

Formato

application/pdf

Identificador

http://gala.gre.ac.uk/1221/1/08_31.pdf

Tilford, Tim, Bailey, Christopher, Parrott, Kevin, Rizvi, M.J., Yin, Chunyan, Sinclair, Keith I. and Desmulliez, Marc P.Y. (2008) Impact of assembly process technologies on electronic packaging materials. International Conference on Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 1-6. ISBN 978-1-4244-2739-0 (online) 978-1-4244-2740-6 (print) (doi:10.1109/ICEPT.2008.4607039 <http://doi.org/10.1109/ICEPT.2008.4607039>)

Idioma(s)

en

Publicador

Institute of Electrical and Electronics Engineers, Inc.

Relação

http://gala.gre.ac.uk/1221/

http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4607039

10.1109/ICEPT.2008.4607039

Palavras-Chave #TK Electrical engineering. Electronics Nuclear engineering
Tipo

Book Section

PeerReviewed