Accurate Range Image Registration: Eliminating or Modelling Outliers


Autoria(s): Li, Longzhuang; Liu, Honghai; Wei, Baogang; Liu, Yonghuai
Contribuinte(s)

Department of Computer Science

Vision, Graphics and Visualisation Group

Data(s)

05/12/2007

05/12/2007

01/09/2007

Resumo

Liu, Yonghuai, Liu, Honghai, Li, Longzhuang, Wei, Baogang. Accurate Range Image Registration: Eliminating or Modelling Outliers. Proceedings of 12th IEEE Conference on Emerging Technologies and Factory Automation, 2007, pp. 1316-1323. Sponsorship: IEEE

Automatic and accurate range image registration is often a prerequisite step for range image analysis and interpretation. Due to occlusion, appearance and disappearance of points in different images, outliers inevitably occur. In this case, various techniques to eliminate and model outliers have been proposed for accurate range image registration. The objective of this paper is to experimentally investigate which of the outlier elimination and modelling is more effective for the evaluation of possible correspondences established, so that a deep insight into how advanced range image registration algorithms will be developed can be obtained. The experimental results based on both synthetic data and real images show that the outlier modelling often outperforms the outlier elimination in the sense of producing more accurate and robust range image registration results.

preprint

preprint

Formato

8

Identificador

Li , L , Liu , H , Wei , B & Liu , Y 2007 , Accurate Range Image Registration: Eliminating or Modelling Outliers . in IEEE Conference on Emerging Technologies and Factory Automation . pp. 1316-1323 , 12th IEEE Conference on Emerging Technologies and Factory Automation , Patras , Greece , 25-28 September . DOI: 10.1109/EFTA.2007.4416933

conference

978-1-4244-0825-2

978-1-4244-0826-9

PURE: 575575

PURE UUID: bc47d6ca-51a7-4434-8594-f4fa39ce741a

dspace: 2160/385

http://hdl.handle.net/2160/385

http://dx.doi.org/10.1109/EFTA.2007.4416933

Idioma(s)

eng

Relação

IEEE Conference on Emerging Technologies and Factory Automation

Tipo

/dk/atira/pure/researchoutput/researchoutputtypes/contributiontobookanthology/conference

Direitos