Controlled growth of uniform silver clusters on HOPG


Autoria(s): Wang, LL; Ma, XC; Qi, Y; Jiang, P; Jia, JF; Xue, QK; Jiao, J; Bao, XH
Data(s)

01/11/2005

Resumo

We have investigated growth of silver clusters on three different, i.e. normally cleaved, thermally oxidized and Ar+ ion sputtered highly oriented pyrolytic graphite (HOPG), surfaces. Scanning tunneling microscopy (STM) observations reveal that uniformly sized and spaced Ag clusters only form on the sputtered surface. Ar+ sputtering introduces relatively uniform surface defects compared to other methods. These defects are found to serve as preferential sites for Ag cluster nucleation, which leads to the formation of uniform clusters. (c) 2005 Elsevier B.V. All rights reserved.

Identificador

http://159.226.238.44/handle/321008/93055

http://www.irgrid.ac.cn/handle/1471x/184539

Idioma(s)

英语

Fonte

王立莉;马旭村;齐云;姜鹏;贾金锋;薛其坤;焦健;包信和.Controlled growth of uniform silver clusters on HOPG,Ultramicroscopy,2005,105():40183

Palavras-Chave #silver clusters #scanning tunneling microscopy #highly oriented pyrolytic graphite
Tipo

期刊论文