Analysis of high wheat yields in Northwest China

Grain yields of over 14 Mg ha(-1) were reported in 1978 for spring wheat (Triticum aestivum L.) grown in Northwest China. Understanding the circumstances under which this record yield was achieved may be useful in defining the key factors that lead to high grain yields and in determining the limits to wheat yield. A relatively simple, mechanistic model was used in an effort to simulate the record yield. The model was used as a framework in which various crop traits could be adjusted to match the observed crop growth. The weather that was characterized by cool temperatures and high levels of solar radiation, proved to be especially important in allowing a full-season crop to achieve record yields. Variables defining plant development in the model also had to be set to describe the high yielding cultivar grown in China. Leaf development was defined by the length of a phyllochron, which was set equal to 78 TU (thermal units, base temperature equal to 0 degrees C) based on independent data. The description of grain fill had to be defined to match simulation results with the observations. Two variables, length of the grain-fill period and the grain growth rate, were set in response to the unique traits of this cultivar and the low temperatures during grain development. These simulations led to important suggestions for examining the interaction between cool temperature regimes and developmental traits of wheat cultivars. (C) 1997 Published by Elsevier Science Ltd.