Scanning tunneling microscopy characterization of electrode materials in electrochemistry


Autoria(s): Li J; Wang EK
Data(s)

1996

Resumo

Ex situ and in situ STM characterization of the electrode materials, including HOPG, GC, Au, Pt and other electrodes, is briefly surveyed and critically evaluated. The relationship between the electrode activity and surface microtopography is discussed.

Identificador

http://ir.ciac.jl.cn/handle/322003/25555

http://www.irgrid.ac.cn/handle/1471x/157505

Idioma(s)

英语

Fonte

Li J;Wang EK.Scanning tunneling microscopy characterization of electrode materials in electrochemistry,ELECTROANALYSIS,1996,8(2):107-112

Palavras-Chave #ORIENTED PYROLYTIC-GRAPHITE #GLASSY-CARBON ELECTRODES #ATOMIC FORCE MICROSCOPY #SULFURIC-ACID-SOLUTION #INSITU STM #TUNNELLING MICROSCOPY #SURFACE-TOPOGRAPHY #PLATINUM SURFACES #AQUEOUS-SOLUTIONS #RESOLUTION
Tipo

期刊论文