Intensity exaggeration of endohedral metallofullerenes in laser-desorption-ionization time-of-flight mass spectrometry


Autoria(s): Sun DY; Xu WG; Liu SY
Data(s)

1998

Resumo

The laser-desorption-ionization time-of-flight mass spectrometry and desorption-electron-ionization mass spectrometry were employed for the characterization of metallofullerenes extract. it was found that the relative intensities of metallofullerenes in this positive-ion, negative-ion LD-TOF MS and DEI MS were much different. This phenomenon should have relationship with the peculiar ionization energies and electron affinities of metallofullerenes.

Identificador

http://202.98.16.49/handle/322003/22557

http://www.irgrid.ac.cn/handle/1471x/156013

Idioma(s)

英语

Fonte

Sun DY;Xu WG;Liu SY.Intensity exaggeration of endohedral metallofullerenes in laser-desorption-ionization time-of-flight mass spectrometry,CHINESE CHEMICAL LETTERS,1998,9(8):761-764

Palavras-Chave #FULLERENES #C-60
Tipo

期刊论文