Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope


Autoria(s): Du BY; VanLandingham MR; Zhang QL; He TB
Data(s)

2001

Resumo

Nanometer-scale plowing friction and wear of a polycarbonate thin film were directly measured using an atomic force microscope (AFM) with nanoscratching capabilities. During the nanoscratch tests, lateral forces caused discrepancies between the maximum forces for the initial loadings prior to the scratch and the unloading after the scratch. In the case of a nanoscratch test performed parallel to the cantilever probe axis, the plowing friction added another component to the moment acting at the cantilevered end compared to the case of nanoindentation, resulting in an increased deflection of the cantilever. Using free-body diagrams for the cases of nanoindentation and nanoscratch testing, the AFM force curves were analyzed to determine the plowing friction during nanoscratch testing. From the results of this analysis, the plowing friction was found to be proportional to the applied contact force, and the coefficient of plowing friction was measured to be 0.56 +/- 0.02. Also, by the combination of nanoscratch and nanoindentation testing, the energetic wear rate of the polycarbonate thin film was measured to be 0.94 +/- 0.05 mm(3)/(N m).

Identificador

http://202.98.16.49/handle/322003/20811

http://www.irgrid.ac.cn/handle/1471x/155140

Idioma(s)

英语

Fonte

Du BY;VanLandingham MR;Zhang QL;He TB.Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope,JOURNAL OF MATERIALS RESEARCH,2001,16(5):1487-1492

Palavras-Chave #RESISTANCE #INDENTATION
Tipo

期刊论文